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Nano Secondary Ion Mass Spectrometer

Nano Secondary Ion Mass Spectrometer Leading Research Equipment Home

Nano-Secondary Ion Mass Spectrometer

Equipment Introduction

The nano secondary ion mass spectrometer (Nano-SIMS; model: Nano SIMS 50), which can perform quantitative imaging with a focused 50-nm primary ion beam of the distribution of trace elements in materials, is operated as national co-utilization equipment in the high-tech materials research field.

Equipment Characteristics

  • World’s best spatial resolution (50 nm) among secondary ion mass spectrometers
  • Multiple detection of impurity elements in a small area
  • High-sensitivity imaging of light elements (including hydrogen)
  • Highly reproducible analysis of insulating samples

Representative Research Case

Microstructure and mechanical properties of interstitial elements in vanadium by Nano-SIMS analysis

  • We investigated the microstructure and mechanical properties of interstitial elements such as oxygen and nitrogen in vanadium, which is of interest as a membrane material in hydrogen separation, purification, and storage application
  • Nano-SIMS was used to determine the oxygen and nitrogen distribution in grain boundarie
  • Both interstitial oxygen and interstitial nitrogen strengthen vanadium through solid solution strengthening and affect ductility, leading to failure at high concentrations

(a) Fracture-surface image of interstitial nitrogen in vanadium.
(b) Stress and strain curves of interstitial nitrogen in vanadium.
(c) Nano-SIMS image of interstitial elements in vanadium.