XPS/XRD/Trace Element Analysis Group
The XPS/XRD/Trace Element Analysis Group consists of instruments that analyze microscopic properties such as elemental composition and crystal/bonding structures of organic and inorganic materials using X-rays or specific detection principles. These instruments provide fundamental technologies for material analysis required in academic, industrial, and research fields, including surface and bulk property analysis, trace element quantification, and crystallinity evaluation, based on analytical science techniques.
Representative Equipment
- AiSAS
- Reveals actual phenomena occurring during the operation of battery, catalyst, and sensor materials
AiSAS
Characteristics and Technical Strengths of Equipment
- Precise elemental quantification at ppm to ppb levels
- Non-destructive analysis of crystal structure and chemical states
- Capable of depth analysis from surface to bulk levels
Application Fields
- Organic and inorganic materials, thin films, energy and environmental materials, etc.