Intelligent EM Research Group
Integration of AI-based analytical technologies with electron microscopy systems for high-resolution microstructural analysis and quantitative data interpretation
- Development of automated analytical technologies for structural and performance characterization of advanced materials such as secondary batteries and semiconductors through AI analysis, in-situ TEM, and 3D reconstruction
Research Infrastructure
Comprehensive suite of electron microscopy-based analytical platforms, with equipment and expertise covering the entire analysis cycle from FIB and sample preparation to Cryo, in-situ, and spectral analysis
- Dr. Hae-Jin Kim’s research team selected as part of the 2025 Global Top Strategic Research
Equipment
- HVEM
- Mono Cs TEM
- Cs TEM
- Double Cs TEM
- FIB
- Cryo FIB
- Air-isolated chamber
- In-situ TEM/SEM
- Ultra-high-resolution EELS system
Key Technologies
- Cryo environment-based sample preparation and low-damage
- Energy research based on air-isolated
- Multi-dimensional image acquisition and condition optimization using 4D STEM
- Ultra-high-resolution mono-EELS with noise reduction and quantitative analysis
- ADevelopment of AI-based segmentation, 3D reconstruction, and real-time automated interpretation workflow
Next-Generation Electron Microscopy for Atomic-Scale Advanced Analysis with Large-Scale AI Applications
