High-Resolution Secondary Ion Mass Spectrometer
High-Resolution Secondary Ion Mass Spectrometer Leading Research Equipment Home
The high-resolution secondary ion mass spectrometer (HR-SIMS; model: SHRIMPIIe/MC), which can measure the isotope ratio at microscopic surface areas in solid materials, has been operated for studies on geotectonic age and surface analysis of trace isotope elements.
- The KBSI SHRIMP is the first high-resolution secondary ion mass spectrometer in Korea
- Low detection limit (~1 ppm) with a mass resolution of 10,000 and transmission of 50%
- Multi-collection system with charge-mode electrometers can measure Pu isotopes simultaneously
Representative Research Case
Post-collisional carbonatite-hosted rare-earth-element mineralization in the Hongcheon area, central Gyeonggi massif
- SHRIMP U-Th-Pb monazite results from carbonatite in the Hongcheon area demonstrated the occurrence of mantle-derived alkaline igneous activities and associated rare-earth-element mineralization following the North and South China collision
- Sr-Nd isotope analysis revealed that the metasomatism in the lithospheric mantle source of the Hongcheon carbonatite must have occurred in the distant past
(a) Geological map of central Korean peninsula. (b) SHRIMP U-Th-Pb monazite results from carbonatite in the Hongcheon area.