skip navigation bar
go content
go menu


High-Resolution Secondary Ion Mass Spectrometer

High-Resolution Secondary Ion Mass Spectrometer Leading Research Equipment Home

High Resolution-Secondary Ion Mass Spectrometer

Equipment Introduction

The high-resolution secondary ion mass spectrometer (HR-SIMS; model: SHRIMPIIe/MC), which can measure the isotope ratio at microscopic surface areas in solid materials, has been operated for studies on geotectonic age and surface analysis of trace isotope elements.

Equipment Characteristics

  • The KBSI SHRIMP is the first high-resolution secondary ion mass spectrometer in Korea
  • Low detection limit (~1 ppm) with a mass resolution of 10,000 and transmission of 50%
  • Multi-collection system with charge-mode electrometers can measure Pu isotopes simultaneously

Representative Research Case

Post-collisional carbonatite-hosted rare-earth-element mineralization in the Hongcheon area, central Gyeonggi massif

  • SHRIMP U-Th-Pb monazite results from carbonatite in the Hongcheon area demonstrated the occurrence of mantle-derived alkaline igneous activities and associated rare-earth-element mineralization following the North and South China collision
  • Sr-Nd isotope analysis revealed that the metasomatism in the lithospheric mantle source of the Hongcheon carbonatite must have occurred in the distant past
  • (a) Geological map of central Korean peninsula. (b) SHRIMP U-Th-Pb monazite results from carbonatite in the Hongcheon area.