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Nano Secondary Ion Mass Spectrometer

Nano Secondary Ion Mass Spectrometer Leading-edge Equipment Home

Equipment Introduction

The Nano Secondary Ion Mass Spectrometer (Nano-SIMS, model:Nano SIMS 50) can perform the quantitative imaging process with focused 50 nm primary ion beams for the distribution of trace elements in materials. It is operated as national coutilization equipment.

Characteristics of the Equipment

  • World’s best spatial resolution (50 nm) in a secondary ion mass spectrometer
  • Multiple detection of impurity elements in a small area
  • High-sensitivity imaging of light elements (including hydrogen)

Representative Research Case

A Study of cation transfer phenomena using Nano secondary ion mass spectrometer

Nano-SIMS was utilized to investigate selective proton transport on the surface of single-walled carbon nanotubes depending on the application of electric field on the surface as well as the transport control mechanism.

Nano SIMS ion image of chlorine on single-walled carbon nanotube

Application

  • NanoSIMS image acquisition of hydrogen in TWIP Steel
  • NanoSIMS image acquisition of Ag and Au coated Ni powder

Representative Research Papers

  • Self-healing behavior of Inconel 617B superalloy
    Kang, S. H., Lee, S., Suh, J. Y., Kim, H. J., & Lee, Y. K. (2019).
    Self-healing behavior of Inconel 617B superalloy. Journal of Alloys and Compounds, 805, 1217-1223. https://doi.org/10.1016/j.jallcom.2019.07.204
  • The Exterior of Single-Walled Carbon Nanotubes as a Millimeter-Long Cation-Preferring Nanochannel
    Yun-Tae Kim, Se Hun Joo, Hyegi Min, Jiyun Lee, Seung Min Moon, Mirang Byeon, Tae Eun Hong, Michael S. Strano, Jae-Hee Han, Sang Kyu Kwak , and Chang Young Lee
  • In Vitro Tracking of Intracellular Metabolism-Derived Cancer Volatiles via Isotope Labeling
    Dong-Kyu Lee, Euiyeon Na, Seongoh Park, Jeong Hill Park, Johan Lim, and Sung Won Kwon
  • Precipitation correlation between MC carbide and Nb-rich M2P phosphide in a TP347H austenitic stainless steel
    Chang-Wan Hong, Yoon-Uk Heo, Nam-Hoe Heo, Sung-Joon Kim,
    Materials Characterization vol. 124, 192-205 (2017), doi: 10.1016/j.matchar.2016.12.024
  • Effect of oxygen and nitrogen on microstructure and mechanical properties of vanadium
    Min-Gu Jo, Phaniraj P. Madakashira, Jin-Yu Suh, Heung Nam Han,
    Materials Science and Engineering: A vol. 675, 92-98 (2016), doi: 10.1016/j.msea.2016.08.040
  • Evaluation of the effect of B and N on the microstructure of 9Cr–2W steel during an aging treatment for SFR fuel cladding tubes
    Eun Hee Jeong, Sang-Gyu Park, Sung Ho Kim, Young Do Kim,
    Journal of Nuclear Materials vol. 467, 527-533 (2015), doi: 10.1016/j.jnucmat.2015.09.026
  • Traces of isotopic reactive species produced from a non-thermal plasma jet in bio-molecules
    C B Lee, H S Kwak, E H Choi, T E Hong, H Yoon, Y Lee, K Y Baik and H S Uhm,
    New Journal of Physics, Volume 17, November 2015, doi: 10.1088/1367-2630/17/11/113031
  • Combined nano-SIMS/AFM/EBSD analysis and atom probe tomography, of carbon distribution in austenite/ε-martensite high-Mn steels
    Jae-Bok Seol, B.-H. Lee, P. Choi, S.-G. Lee, C.-G. Park,
    Ultramicroscopy vol 132, 248-257 (2013), doi: 10.1016/j.ultramic.2013.01.009
  • Effects of Al on microstructure and tensile properties of C-bearing high Mn TWIP steel
    J.-E. Jin, Y.-K. Lee,
    Acta Materialia vol. 60, 1680-1688 (2012), doi: 10.1016/j.actamat.2011.12.004
  • On the Role of Grain Boundary Serration in Simulated Weld Heat-Affected Zone Liquation of a Wrought Nickel-Based Superalloy
    Hyun Uk Hong, In Soo Kim, Baig Gyu Choi, Young Soo Yoo, Chang Yong Jo,
    Metallurgical and Materials Transactions A vol. 43, 173-181 (2012),doi: 10.1007/s11661-011-0837-2
  • Nano SIMS characterization of boron- and aluminum-coated LiNi1/3Co1/3Mn1/3O2 cathode materials for lithium secondary ion batteries
    Tae Eun Hong, E. D. Jeong, S. R. Baek, M. R. Byeon, Young-Suck Lee, F. Nawaz Khan, Ho-Soon Yang,
    Journal of Applied Electrochemistry, vol. 42, 41-46 (2012), doi: 10.1007/s10800-011-0369-x